Using a New Approach to Analyze A Depth Profile of Double Bond Conversion in Model Formulations

Industry: Adhesives
R. Bao, S. Joensson, 2007 Conference

A new approach of analyzing the depth profile of double bond conversion as a function of film depth had been discussed. By using a combination of statistical calculation and traditional FTIR, a new approach to analyze the depth profile of conversion "layer by layer"in the characterization of photopolymerization was explored.

Costs:  € 10,00 
Contents:  6 pages